Ключевые слова: presentation, HTS, REBCO, coated conductors, doping, fabrication, IBAD process, PLD process, high rate process, doping, coils pancake, current-voltage characteristics, uniformity, Jc/B curves, angular dependence, critical current, magnetic field dependence, mechanical properties, thickness dependence, fatigue behavior, stress effects, strain effects
Ключевые слова: presentation, HTS, REBCO, coated conductors, fabrication, IBAD process, PLD process, status, critical caracteristics, critical current, magnetic field dependence, angular dependence, mechanical properties, tensile tests, strain effects, stress effects, bending process, compression, delamination, magnets sextupole, conduction cooled systems, coils pancake, test results
Yoshida Y., Iijima Y., Furuse M., Kakimoto K., Fujita S., Yoshida T., Daibo M., Ohsugi M., Hirata W.
Iijima Y., Awaji S., Kiss T., Kakimoto K., Fujita S., Yoshida T., Daibo M., Okada T., Muto S., Hirata W.
Ключевые слова: HTS, EuBCO, coated conductor modules, fabrication, PLD process, IBAD process, pinning, doping effect, pinning centers artificial, growth rate, critical caracteristics, critical current distribution, microstructure, Jc/B curves, pinning force, critical current density, angular dependence, critical current, magnetic field dependence, experimental results
Iijima Y., Awaji S., Kiss T., Kakimoto K., Fujita S., Igarashi M., Adachi Y., Naoe K., Yoshida T., Okada T., Muto S., Hirata W.
Ключевые слова: HTS, EuBCO, coated conductors, long conductors, PLD process, IBAD process, doping effect, pinning centers artificial, fabrication, critical caracteristics, critical current, angular dependence, thickness dependence, temperature dependence, pinning force, magnetic field dependence, microstructure, homogeneity, experimental results, length
Iijima Y., Higashikawa K., Awaji S., Kiss T., Kakimoto K., Fujita S., Igarashi M., Fukuzaki T., Adachi Y., Naoe K., Yoshida T., Daibo M., Muto S., Hirata W.
Ключевые слова: HTS, GdBCO, EuBCO, coated conductors, fabrication, doping effect, PLD process, IBAD process, uniformity, homogeneity, substrate Hastelloy, critical caracteristics, critical current density, pinning force, magnetic field dependence, Jc/B curves, critical current, angular dependence, microstructure, temperature dependence, experimental results
Iijima Y., Kakimoto K., Fujita S., Itoh M., Igarashi M., Hanyu S., Adachi Y., Nakamura N., Kikutake R., Daibo M., Nagata M., Ohsugi M., Tateno F.
Iijima Y., Fuji H., Kakimoto K., Sutoh Y., Fujita S., Itoh M., Igarashi M., Hanyu S., Tobita H., Nakamura N., Kikutake R., Daibo M., Nagata M.
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Sutoh Y., Itoh M., Igarashi M., Hanyu S., Kutami H., Kikutake R., Daibo M., Suzuki R.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Nakamura N., Takemoto T., Kikutake R.
Iijima Y., Higashikawa K., Kiss T., Saitoh T., Izumi T., Inoue M., Imamura K., Kakimoto K., Shiohara K., Kawaguchi T.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K.
Ключевые слова: HTS, coated conductors, long conductors, high rate process, REBCO, IBAD process, PLD process, substrate Ni alloy, fabrication, texture, critical current distribution, length
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Fujita S., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K., Nakamura N.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K., Nakamura N.
Ключевые слова: HTS, REBCO, coated conductors, IBAD process, buffer layers, texture, microstructure, fabrication, length
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Fujita S., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Morita K., Nakamura N.
Iijima Y., Saitoh T., Kakimoto K., Sutoh Y., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C., Morita K.
Ключевые слова: HTS, REBCO, IBAD process, high rate process, fabrication, long conductors, texture, critical caracteristics, critical current, length
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
Iijima Y., Saitoh T., Fuji H., Kakimoto K., Igarashi M., Hanyu S., Hanada Y., Kutami H., Hayashida T., Tashita C.
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